High Voltage Technology Selection Guide
Selection Guide:
| Process Name | H35B3KC |
H35B3LC |
H35B4KD |
H35B4LD | H35B4D3 | CXT | CXY | CXZ |
| Process features | 2P, 3M, HRP, 20V | 2P, 3M, HRP, 5V, 20V | 2P, 4M, HRP, TM, 20V | 2P, 4M, HRP, TM, 5V, 20V | 2P, 4M, HRP, TM, S, 5V, 20V | 2M, 1P, S | 2M, 2P, S |
2M, 2P, |
| Number of masks | 18 | 21 | 21 | 24 | 27 | 15 | 16 | 17 |
|
Max. operating | 50 | 50 |
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Max. operating | 50 | 50 |
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specific R_on* | 0,11 | 0,34 |
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specific R_on* | 0,29 | 0,8 |
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Drawn LVMOS | 0.35 | 0.8 |
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Operating voltage | 3,3V, 5 V | 5V |
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Max. gate | 3,3V, 5 V, 20V | 5V, 20V |
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| 2M | 2 metal layers |
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| 3M | 3 metal layers |
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| 4M | 4 metal layers |
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| 1P | 1 poly layer |
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| 2P | 2 poly layers |
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| HRP | high resistive poly |
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| S | substrate related LV devices |
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| TM | thick metal layer |
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| 5V | 5V gate oxide |
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| 20V | 20V gate oxide |
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| * | the specific Ron is calculated from the minimum transistor source drain pitch. The value does not include design related substrate contacts or guard rings. |
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| ** | Isolated LVMOS logic can be raised up to 50V Design blocking voltage |
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| *** | Process option available on request |


