Mismatch Modeling
austriamicrosystems provides device mismatch models integrated in the Monte Carlo simulation environment of the HIT-Kit (process design kit).
This tool enables the simulation of the mismatch behaviour for all major semiconductor devices such as resistors, capacitors, MOS (Bsim3v3) and bipolar transistors (VBIC and Gummel-Poon). The measurement based mismatch parameters are valid for all geometries and are gained from specially designed mismatch test structures free of systematic influences. The provided mismatch modeling is a necessary feature for the robust design of many analog circuits (common mode rejection ratio, offset voltage, current mirrors).
Monte Carlo models for mismatch simulations can be downloaded from the austriamicrosystems Support Information Center (ASIC) download area.