Noise Modeling
austriamicrosystems active device models enable accurate simulation of 1/f noise and design for optimum noise performance.
The noise models are part of the standard SPICE model libraries and can be downloaded for a wide range of analog circuit simulators (Spectre, ELDO, HSPICE, ADS, SMARTSPICE, SABER, PSPICE and SMASH) from the download area of our technical web-server.
Low frequency noise strongly influences the performance of integrated CMOS and BiCMOS analog circuits (LNA's, A/D converters, VCO's etc.). Flicker noise and white noise is characterized and modelled for all active devices like MOS transistors (BSIM3V3) and bipolar transistors (VBIC and SGP). The extraction of parameters is based on noise measurements for a wide range of geometries and operating points.
High frequency noise (NFmin) is measured and characterized for BiCMOS and SiGe BiCMOS transistors.
The accuracy of the noise models is verified by comparing noise measurements and simulation of analog benchmark circuits.


