Statistical SPICE Modeling
austriamicrosystems provides process corner models and Monte Carlo simulation libraries to enable robust mixed signal circuit design.
Those statistical models are part of the standard SPICE model libraries and can be downloaded for a wide range of analog circuit simulators from the download area of our technical web-server.
For the development of robust designs process variations and local mismatch effects have to be considered already during the design phase. Special SPICE model libraries allow to simulate the effect of varying process conditions and to center the design for optimum yield. Therefore, parametric yield losses and costly design iterations can be avoided at the very beginning.
Besides the standard best case/worst case model libraries Monte Carlo models as well as statistical corner models are provided for all types of devices (MOS, bipolar, resistors, capacitors and inductors). All statistical models are based on a multitude of electrical test parameters (production control parameters) monitored on every silicon wafer. A perfect match between the statistical SPICE models and the physical process is possible because of the close cooperation between the factory and the process characterization teams.